Battery Contacts
Battery contacts serve as a robust interface for power supply and charging of mobile devices as well as for contacting battery cells in testing environments.

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The FIXTEST product world is mainly centred around spring contact probes. These are primarily used for testing electronic assemblies. Spring contact probes are used as contact elements in in-circuit test fixtures and for functional testing of assemblies.
Our high-current spring contact probes are optimised for testing power electronics and battery cells. The contact probes are also ideal for charging applications for automated guided vehicles.
You can use battery contacts to charge mobile devices and wearables or connect modular assemblies with the spring contact probes.

Upon request, we additionally refine highly stressed spring contact pins with our in-house developed XXLonglife coating . This allows you to benefit, among other things, from easy-to-clean contacts, fewer failures, and longer service life.
Simply use our contact form, specify the desired item and quantity, and we will be happy to provide you with a corresponding quotation.
Battery contacts serve as a robust interface for power supply and charging of mobile devices as well as for contacting battery cells in testing environments.

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Fine pitch contacts enable reliable contacting of extremely small center-to-center spacings on highly integrated PCBs and components.

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High current contacts are designed for transferring high electrical power, ensuring low-loss connections when testing power electronics.

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Test probes provide the precise electrical interface between test systems and PCBs to verify correct assembly and functionality through ICT and FCT procedures.

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Receptacles act as replaceable holders for test probes, allowing for quick probe replacement without the need for desoldering on the test fixture.

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High-current special solutions include heavy-duty test probes and innovative, coolable contact pins designed for maximum current loads in power electronics.

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Rigid contacts provide a robust and stationary connection solution for applications where no spring action is required, but maximum mechanical stability and constant conductivity are essential.

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Specialized fine-pitch solutions for the smallest center-to-center spacings, including exclusive high-precision probes of Japanese manufacture for advanced semiconductor testing.

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