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Test Probes

ICT/FCT contacts imperial sizes

The most common test methods in the quality inspection of electronic assemblies are the In-Circuit Test (ICT), the MDA test (Manufacturing Defects Analysis) and the Functional Test (FCT). In all these cases a device filled with spring contact probes is needed which creates the electrical connection between DUT (Device Under Test) and the testing electronics.

In the section "ICT/FCT imperial" we present our series with drill sizes from the american drill bit size gauge. These sizes are standard in the market and compatible to products form other manufacturers.
For test probes with metric drill sizes, please take a look at our section ICT/FCT metric.

Series	Overall length (mm)	Spacing (mm)	Maximum travel (mm)	Recomm. travel (mm)	Max. current load (A)
100	33,40	2,54	6,40	4,20	3,0
108	35,90	1,00	6,90	4,60	1,0
105	20,70	0,80	3,50	2,00	1,0
106	20,70	1,00	3,50	2,00	1,0
107	33,50	1,00	4,50	2,20	1,0
07	16,80	1,27	2,54	1,70	2,0
071	36,80	1,27	6,35	4,20	2,0
141	34,60	1,27	6,35	4,20	2,0
14	40,30	1,27	3,50	1,40	2,0
15	43,20	1,27	6,40	4,30	2,5
18	17,00	1,90	3,00	2,00	2,5
75	33,10	1,90	6,40	4,20	2,5
751	30,70	1,90	5,30	2,70	2,5
752	35,10	1,90	8,40	4,30	2,5
21	24,70	2,54	4,00	2,70	3,0
125	38,70	2,54	11,80	9,00	3,0
211	16,90	2,54	2,50	1,70	3,0
26	33,00	3,18	6,35	4,20	4,0
27	33,75	3,96	6,35	4,20	4,0
120	33,25	2,54	6,35	4,20	8,0
28	36,15	4,80	6,35	4,20	5,0
126	33,00	3,20	6,35	4,20	8,0
226	33,00	3,20	6,35	4,20	30,0
127	33,75	4,00	6,35	4,20	15,0
128	36,15	4,75	6,35	4,20	15,0
29	min. 9,48	2,54	1,52	1,27	3,0
115	45,20	1,27	6,35	4,30	2,5
V75X	33,10	1,90	6,40	4,20	2,5
V100X	33,40	2,54	6,40	4,20	3,0