The most common test methods in the quality inspection of electronic assemblies are the In-Circuit Test (ICT), the MDA test (Manufacturing Defects Analysis) and the Functional Test (FCT). In all these cases a device filled with spring contact probes is needed which creates the electrical connection between DUT (Device Under Test) and the testing electronics.

In the section "ICT/FCT imperial" we present our series with drill sizes from the american drill bit size gauge. These sizes are standard in the market and compatible to products form other manufacturers.
For test probes with metric drill sizes, please take a look at our section ICT/FCT metric.