ICT/FCT contacts metric sizes

The most common test methods in the quality inspection of electronic assemblies are the In-Circuit Test (ICT), the MDA test (Manufacturing Defects Analysis) and the Functional Test (FCT). Each test method has it‘s limits in terms of test coverage and fault detection and diagnosis, so it often makes sense to combine different test methods with each other. In all these cases a device filled with spring contact probes is needed which creates the electrical connection between UUT (Unit Under Test) and the testing electronics.

 

In the section ICT/FCT contacts the most common designs of test probes are shown. Most of them are compatible with other brands on the international market. If you find yourself getting lost in the great selection, please just call us - we assist you in direct consultation.

Series Overall length
(mm)
Spacing
(mm)
Maximum travel
(mm)
Recomm. travel
(mm)
Max. current load
(A)
30
Series 30
32,50 2,54 5,00 3,30 3,0
31
Series 31
35,50 2,54 5,00 3,30 3,0
40
Series 40
38,50 2,54 8,00 5,30 3,0
41
Series 41
38,50 2,54 8,00 5,30 3,0
42
Series 42
35,50 2,54 8,00 5,30 3,0
44
Series 44
37,90 2,54 10,40 7,00 3,0
49
Series 49
35,50 2,54 8,00 5,30 3,0
50
Series 50
24,80 3,80 5,00 3,40 4,0
150
Series 150
27,00 3,80 5,00 3,40 4,0
154
Series 154
30,00 3,80 5,00 3,40 4,0
155
Series 155
35,00 3,80 5,00 3,40 4,0
51
Series 51
34,10 3,80 5,00 3,40 8,0
60
Series 60
31,00 4,50 6,00 4,00 4,0
61
Series 61
37,95 4,50 7,00 4,00 12,0