ICT/FCT contacts imperial sizes

The most common test methods in the quality inspection of electronic assemblies are the In-Circuit Test (ICT), the MDA test (Manufacturing Defects Analysis) and the Functional Test (FCT). In all these cases a device filled with spring contact probes is needed which creates the electrical connection between DUT (Device Under Test) and the testing electronics.

In the section "ICT/FCT imperial" we present our series with drill sizes from the american drill bit size gauge. These sizes are standard in the market and compatible to products form other manufacturers.
For test probes with metric drill sizes, please take a look at our section ICT/FCT metric.

Series Overall length
(mm)
Spacing
(mm)
Maximum travel
(mm)
Recomm. travel
(mm)
Max. current load
(A)
100
Series 100
33,40 2,54 6,40 4,20 3,0
108
Series 108
35,90 1,00 6,90 4,60 1,0
105
Series 105
20,70 0,80 3,50 2,00 1,0
106
Series 106
20,70 1,00 3,50 2,00 1,0
107
Series 107
33,50 1,00 4,50 2,20 1,0
07
Series 07
16,80 1,27 2,54 1,70 2,0
071
Series 071
36,80 1,27 6,35 4,20 2,0
141
Series 141
34,60 1,27 6,35 4,20 2,0
14
Series 14
40,30 1,27 3,50 1,40 2,0
15
Series 15
43,20 1,27 6,40 4,30 2,5
18
Series 18
17,00 1,90 3,00 2,00 2,5
75
Series 75
33,10 1,90 6,40 4,20 2,5
751
Series 751
30,70 1,90 5,30 2,70 2,5
752
Series 752
35,10 1,90 8,40 4,30 2,5
21
Series 21
24,70 2,54 4,00 2,70 3,0
125
Series 125
38,70 2,54 11,80 9,00 3,0
211
Series 211
16,90 2,54 2,50 1,70 3,0
26
Series 26
33,00 3,18 6,35 4,20 4,0
27
Series 27
33,75 3,96 6,35 4,20 4,0
120
Series 120
33,25 2,54 6,35 4,20 8,0
28
Series 28
36,15 4,80 6,35 4,20 5,0
126
Series 126
33,00 3,20 6,35 4,20 8,0
226
Series 226
33,00 3,20 6,35 4,20 30,0
127
Series 127
33,75 4,00 6,35 4,20 15,0
128
Series 128
36,15 4,75 6,35 4,20 15,0
29
Series 29
min. 9,48 2,54 1,52 1,27 3,0
115
Series 115
45,20 1,27 6,35 4,30 2,5
V75X
Series V75X
33,10 1,90 6,40 4,20 2,5
V100X
Series V100X
33,40 2,54 6,40 4,20 3,0